The series of international symposia entitled “Atomic Level Characterization (ALC)” started in 1996 with the meeting in Kyoto, Japan under the auspices of the 141st Committee on Microbeam Analysis of the Japan Society for the Promotion of Science (JSPS). The ALC symposia focus on practical applications of atomic level characterization (both atomic dimensions and energy levels) of new materials and devices, including bio- and organic materials as well as inorganics. Descriptions of new applications and instrumentation for various analytical techniques of surface and interface analysis are solicited in these symposia. The goal is to promote stimulating discussions among researchers specializing in different probe methods. The symposium also encourages discussion of fundamental problems to be solved in the further development of atomic level characterization of materials, including approaches based on theory and simulations.
The 2nd ALC symposium was held at Maui (Hawaii) in 1997, the 3rd one at Nara (Japan) in 2001, the 4th at Kauai (Hawaii) in 2003, the 5th Kailua-Kona (Hawaii) in 2005, the 6th at Kanazawa (Japan) in 2007, the 7th at Maui (Hawaii) in 2009, the 8th at Seoul (Korea) in 2011, the 9th at Kona (Hawaii) in 2013, the 10th at Matsue (Japan) in 2015, and 11th at Kauai (Hawaii) in 2017. It is time to gather again for ALC'19, which will be held in Kyoto, Japan.
The official language of the symposium is English.
|Sponsored by the 141st Committee on Microbeam Analysis, JSPS|
|Current time: 2019-09-20 08:04:54 JST|