ALC'19 Logo
ALC '19
October 20 (Sun) – 25 (Fri), 2019
Miyako Messe, Kyoto JAPAN

Scientific Topics

The sessions will cover the following topics:

  1. Fundamental Phenomena
    • electron/ion/photon -solid interactions
    • emission phenomena of light, electrons, and ions
  2. Characterization by Electrons / Ions / Infrared / Ultraviolet / X-rays
    • AES / XPS / XPED / EPMA / ISS / MEIS / RBS / SIMS / IR / etc.
  3. Imaging Techniques
    • TEM / STEM / AEM / SEM / SAM / REM / LEEM / PEEM
    • SPM / FIM / TOF-SIMS / optical molecular imaging / ultrafast imaging / etc.
  4. Applications for Nanotechnology
    • nanowires / nanotubes / nanoparticles / graphene and 2D materials
    • solid-solid / solid-liquid interfaces
  5. Advanced Materials Characterization
    • spintronics materials
    • environmental and advanced energy materials
    • cosmic and terrestrial materials
  6. Special Sessions
    • Characterization of water on materials surface
    • Materials informatics and machine learning
    • Operando spectroscopy and ambient pressure measurements
    • Advanced biological and medical characterization (jointly-organized with SIMS XXII)
  7. Tutorials
FOCUS JEOL SHIMADZU
ScientaOmicron SPECS
Hitachi High-Technologies ThermoFisher TOYO Corporation
HORIBA
KaihatsuJutaku21 TSUJICON
Kyoto MICE Kyoto Travel Kyoto Navi Kyoto Visitors Host
JVSS Logo ASS Logo W-FST Logo Kwansei Gakuin University
Sponsored by the 141st Committee on Microbeam Analysis, JSPS
Current time: 2019-09-20 08:06:21 JST